Laser-induced XUV Spectroscopy (LIXS) : Revealing the potential of high-precision LIBS analysis

Laser-induced XUV spectroscopy (LIXS) has emerged as a promising technique for high-precision analysis in laser-induced breakdown spectroscopy (LIBS), offering improved detection limits, accuracy, and the ability to detect trace heterogeneity in materials. By capturing stable plasma emission in the extreme ultraviolet range, LIXS demonstrated its potential to detect light elements and halogens with a high signal-to-noise ratio, providing researchers with an invaluable tool for conducting advanced material analysis.

Laser induced breakdown spectroscopy (LIBS) has been used as a rapid microanalysis technique for a long time. However, its accuracy is limited by plasma scintillation noise. In a study recently published in Spectrochimica Acta B: Atomic Spectroscopy, the researchers present laser-induced XUV spectroscopy (LIXS) as a promising method to overcome these limitations and achieve high-precision LIBS analysis (1). By collecting stable plasma emission in the extreme ultraviolet (XUV) range, LIXS offers increased accuracy, higher detection limits, and the ability to detect trace heterogeneity in the material.

LIXS works similarly to LIBS, but captures stable plasma emission in the XUV region, which corresponds to the early stages of laser-plasma interaction. The researchers demonstrated that the XUV spectrometer increases the information capacity in a quadratic manner, allowing for higher precision analysis. This study provides an in-depth study of specific electron-ion processes in LIXS plasmas and illustrates how this technique can improve the detection limits and accuracy of LIBS analysis.

One of the significant advantages of LIXS is its ability to detect light elements and halogens with a high signal-to-noise ratio and fractionation-free response. This capability opens up new possibilities for material analysis, where accurate determination of trace elements is essential. The authors discuss various applications of LIXS in material analysis, demonstrating its effectiveness in detecting and quantifying light elements and halogens.

The launch of LIXS represents a significant advance in the field of laser-induced spectroscopy, providing researchers with a powerful tool for high-precision material analysis. By utilizing stable plasma emission in the XUV range, LIXS improves the accuracy of LIBS analysis, allowing for the detection of small heterogeneous and trace elements with superior sensitivity.

Research by Empa Materials Science & Technology and Davide Bleiner and colleagues at the University of Zurich highlights the potential of LIXS and its future impact in the field of microanalytical technology.

As research continues to refine and extend the capabilities of the laser-induced XUV spectrum, the field of materials analysis is expected to benefit from the greater accuracy and sensitivity offered by this innovative approach. The development of LIXS marks a significant step forward in the pursuit of accurate and comprehensive microanalysis techniques, opening the door to new insights and applications across various scientific disciplines.

Source: Laser Net