- No Data
English
- English
- 简体中文
- 繁体中文
- Français
- Русский
- Italiano
- 日本語
- 한국어
- Português
- Deutsch
- Español
- Türkçe
- Ελληνικά
- Nederlands
- Tiếng Việt
- Polski
The fully dielectric element surface has the characteristics of low material loss and strong field localization, making it very suitable for manipulating electromagnetic waves at the nanoscale. Especially the surface of all silicon dielectric elements can achieve ideal compatibility with complementary metal oxide semiconductor technology, making it an ideal choice for large-scale monolithic integr...
Recently, SMART Photonics, a Dutch photonic integrated circuit manufacturer, announced a major decision to transfer its entire production capacity from 3-inch wafers to 4-inch silicon substrates, thereby expanding the production scale of photonic chips and significantly reducing chip prices.According to the company, SMART Photonics is one of the first photonic integrated circuit foundries to provi...
In the future, electric vehicle battery manufacturers can further improve the durability and performance of electric vehicle batteries through compact X-ray sources. The XProLas development partnership has now begun to develop these laser driven X-ray sources under the leadership of TRUMPF. The first batch of demonstration systems will be completed in 2026. In the future, manufacturers will be abl...
Global semiconductor developer BluGlass Limited has received its first α Purchase order for gallium nitride distributed feedback laser.This client is a pioneer in photon and fiber laser technology and will use BluGlass's blue prototype DFB laser to develop cutting-edge defense, aviation, and scientific applications.Quantum sensing, navigation, and computing applications are driving a huge de...
In view of the reconstruction problem of stack imaging technology in noisy environment, Lin Nan's team from Shanghai Institute of Optics and Mechanics, Chinese Academy of Sciences, proposed an innovative method ProPtyNet based on unsupervised physical neural network, which is expected to be applied to chip CD measurement and defect detection. The article was published in Optics and lasers in engin...